DataSetsUni (version 0.1)

Component Failure: Time to failure of an electronic component

Description

The function allows to provide the time to failure in hours of an electronic component subjected to an accelerated life test.

Usage

data_electronicf

Value

data_electronicf gives the time to failure in hours of an electronic component.

Arguments

data_electronicf

A vector of (non-negative integer) values.

Author

Muhammad Imran.

R implementation and documentation: Muhammad Imran .

Details

The data represent the time to failure in hours of an electronic component subjected to an accelerated life test. Recently, it is used by Tripathi. (2021) and fitted the inverse log-logistic distribution.

References

Tripathi, H., Dey, S., & Saha, M. (2021). Double and group acceptance sampling plan for truncated life test based on inverse log-logistic distribution. Journal of Applied Statistics, 48(7), 1227-1242.

Montgomery, D. C. (2010). Managing, controlling, and improving quality. Wiley Global Education.

See Also

data_failureairc, data_windshieldf, data_breakdown

Examples

x<-data_electronicf
summary(x)